Surface Metrology
K. Peeraer bvba
Tel: +32 3 226 42 40
K. Peeraer bvba
Tel: +32 3 226 42 40
Polytec's high-precision TopMap Topography Measuring Systems are state-of-the-art scanning white-light interferometers for non-contact surface profile measurements.
With their large vertical range and nanometer resolution, they are ideal tools for determining smoothness, height differences and parallelism of large surfaces and structures, including soft materials.
Surface measurements are needed in many industries. Components and structures ranging from submillimeter to centimeter size can be found in the semiconductor and data storage industries, in microstructure and sensor markets, and in engineering and automotive applications.
With their large vertical range and nanometer resolution, they are ideal tools for determining smoothness, height differences and parallelism of large surfaces and structures, including soft materials.
Surface measurements are needed in many industries. Components and structures ranging from submillimeter to centimeter size can be found in the semiconductor and data storage industries, in microstructure and sensor markets, and in engineering and automotive applications.
